Field Ion Microscopy (FIM)
Field Ion Microscopy (FIM)
●Features The Field Ion Microscope (FIM) is a projection-type microscope that allows for easy observation of the surface atomic images of sharply pointed metal tips. It was invented in 1951 by Professor Erwin E. Mueller at Pennsylvania State University. This device operates in an ultra-high vacuum environment, gradually increasing the voltage applied to a metal tip (probe) set as the sample, which causes the FIM image to appear on a screen, allowing for the visual observation of the surface atomic irregularities of the needle-like sample magnified approximately one million times. Simultaneously, the application of voltage to the tip provides a cleaning effect that removes impurities adhering to the surface of the tip. Furthermore, by increasing the voltage applied to the tip, field evaporation can be induced, allowing individual atoms to be stripped away and enabling precise adjustment of the number of atoms at the tip. The excellent characteristics of this device are utilized not only for atomic-level observation of metals but also for tip evaluation in scanning tunneling microscopy, where a sharp metal tip is essential. It has a wide range of applications and is adopted in many research laboratories and university research facilities.
- Company：北野精機
- Price：Other
![[SIM] Scanning Ion Microscopy Method](https://image.mono.ipros.com/public/product/image/d09/387108028/IPROS2308410282720757772.jpg?w=280&h=280)
![[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy](https://image.mono.ipros.com/public/product/image/a23/2000442436/IPROS15295605371207538123.jpg?w=280&h=280)
